Learn · Advanced Material Characterization by Atom Probe Tomography and Electron Microscopy
Lecture 42 of 46Week 12 Transmission Electron Microscopy (TEM), Scanning Electron Microscope (SEM) and Correlative Microscopy
Image Formation
Prof. Surendra Kumar Makineni · IISc Bangalore
Credits and licence
- From
- Advanced Material Characterization by Atom Probe Tomography and Electron Microscopy, IISc Bangalore (at NPTEL)
- Licence
- CC BY-NC-SA, as NPTEL states it. Non-commercial use only.
- Attribution
- NPTEL states: "Distributed under Creative Commons Attribution-ShareAlike / CC BY - NC - SA", beside a BY-NC-SA badge.
- Who can watch
- Tweens profiles and older. How courses are placed
All the lectures
- Introduction to the course
- History from electrons to field ionisation to field evaporation
- Filed Ion Microscopy
- Basic physics behind Field Ionisation
- Field Ion Microscopy Instrumentation
- Field Ionisation to Field Evaporation
- Field Desorption Microscopy
- Atom Probe Tomography: Variables
- Instrumentation
- Pulsing methods
- Photon-assisted Ionisation
- Experimental protocols for APT
- Experimental protocols for APT
- Experimental protocols for APT
- Tomographic Reconstruction
- Tomographic Reconstruction
- Tomographic Reconstruction
- Calibration of reconstruction
- Common artifacts in reconstruction
- Spatial resolution in reconstruction
- Electropolishing
- Focused Ion Beam (FIB)
- Focused Ion Beam (FIB)
- Focused Ion Beam (FIB)
- Data analysis
- Quality of data
- Mounting of specimens
- Ion milling of specimens
- Data analysis
- Specimen loading
- Data acquisition
- Data analysis
- Basics
- Basics
- Basics
- Electron specimen interaction
- TEM column cross-section
- Electron Diffraction
- Diffraction Patterns
- Imaging
- Defect analysis
- Image Formation
- Detection of electrons and ECCI
- Application to Materials Science
- Application to Materials Science
- Application to Materials Science