Learn · Advanced Material Characterization by Atom Probe Tomography and Electron Microscopy
Lecture 24 of 46Week 8 Sample Preparation and Reconstruction data
Focused Ion Beam (FIB)
Prof. Surendra Kumar Makineni · IISc Bangalore
Credits and licence
- From
- Advanced Material Characterization by Atom Probe Tomography and Electron Microscopy, IISc Bangalore (at NPTEL)
- Licence
- CC BY-NC-SA, as NPTEL states it. Non-commercial use only.
- Attribution
- NPTEL states: "Distributed under Creative Commons Attribution-ShareAlike / CC BY - NC - SA", beside a BY-NC-SA badge.
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- Tweens profiles and older. How courses are placed
All the lectures
- Introduction to the course
- History from electrons to field ionisation to field evaporation
- Filed Ion Microscopy
- Basic physics behind Field Ionisation
- Field Ion Microscopy Instrumentation
- Field Ionisation to Field Evaporation
- Field Desorption Microscopy
- Atom Probe Tomography: Variables
- Instrumentation
- Pulsing methods
- Photon-assisted Ionisation
- Experimental protocols for APT
- Experimental protocols for APT
- Experimental protocols for APT
- Tomographic Reconstruction
- Tomographic Reconstruction
- Tomographic Reconstruction
- Calibration of reconstruction
- Common artifacts in reconstruction
- Spatial resolution in reconstruction
- Electropolishing
- Focused Ion Beam (FIB)
- Focused Ion Beam (FIB)
- Focused Ion Beam (FIB)
- Data analysis
- Quality of data
- Mounting of specimens
- Ion milling of specimens
- Data analysis
- Specimen loading
- Data acquisition
- Data analysis
- Basics
- Basics
- Basics
- Electron specimen interaction
- TEM column cross-section
- Electron Diffraction
- Diffraction Patterns
- Imaging
- Defect analysis
- Image Formation
- Detection of electrons and ECCI
- Application to Materials Science
- Application to Materials Science
- Application to Materials Science