Learn · Embedded Systems-Design Verification and Test
Lecture 26 of 36Week 8: Introduction to Digital Testing
Automatic Test Pattern Generation (ATPG)
Prof. Santosh Biswas, Prof. Jatindra Kumar Deka and Prof. Arnab Sarkar · IIT Guwahati
Credits and licence
- From
- Embedded Systems-Design Verification and Test, IIT Guwahati (at NPTEL)
- Licence
- CC BY-NC-SA, as NPTEL states it. Non-commercial use only.
- Attribution
- NPTEL states: "Distributed under Creative Commons Attribution-ShareAlike / CC BY - NC - SA", beside a BY-NC-SA badge.
- Who can watch
- Tweens profiles and older. How courses are placed
All the lectures
- Introduction
- Modeling Techniques - 1
- Modeling Techniques - 2
- Hardware/Software Partitioning
- Introduction to Hardware Design
- Hardware Architectural Synthesis - 1
- Hardware Architectural Synthesis - 2
- Hardware Architectural Synthesis - 3
- Hardware Architectural Synthesis - 4
- Hardware Architectural Synthesis - 5
- Hardware Architectural Synthesis - 6
- Hardware Architectural Synthesis - 7
- System Level Analysis
- Uniprocessor Scheduling - 1
- Uniprocessor Scheduling - 2
- Multiprocessor Scheduling - 1
- Multiprocessor Scheduling - 2
- Introduction and Basic Operators of Temporal Logic
- Syntax and Semantics of CTL
- Equivalence between CTL formulas
- Model Checking Algorithm
- Binary Decision Diagram
- Use of OBDDs for State Transition System
- Symbolic Model Checking
- Introduction to Digital VLSI Testing
- Automatic Test Pattern Generation (ATPG)
- Scan Chain based Sequential Circuit Testing
- "Software-Hardware Co-validation Fault Models and High Level Testing for Complex Embedded Systems"
- Testing for embedded cores
- Bus and Memory Testing
- Testing for advanced faults in Real time Embedded Systems
- BIST for Embedded Systems
- Concurrent Testing for Fault tolerant Embedded Systems - 1
- Concurrent Testing for Fault tolerant Embedded Systems - 2
- Testing for Re-programmable hardware
- Interaction Testing between Hardware and Software