Learn · Transmission Electron Microscopy: Theory of Imaging to Advanced Applications
Lecture 11 of 39Week 4
More on electron-specimen interaction
Prof. Sai Rama Krishna Malladi · IIT Hyderabad
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- Transmission Electron Microscopy: Theory of Imaging to Advanced Applications, IIT Hyderabad (at NPTEL)
- Licence
- CC BY-NC-SA, as NPTEL states it. Non-commercial use only.
- Attribution
- NPTEL states: "Distributed under Creative Commons Attribution-ShareAlike / CC BY - NC - SA", beside a BY-NC-SA badge. Coordinated by IIT Madras.
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- Tweens profiles and older. How courses are placed
All the lectures
- Intro to Transmission Electron Microscopy (TEM)
- Layout of TEM, lab tour and overview of components
- Electron Sources: Types of Electron Sources
- Electron Sources: Charateristics and influence on imaging
- Electron Lenses
- Image Formation in TEM & Function of a Lens - Part 1
- Image Formation in TEM & Function of a Lens - Part 2
- Apertures, Detectors & Specimen Preparation
- Signals in a TEM
- Scattering Cross Section & Projected Potential
- More on electron-specimen interaction
- Contrast mechanisms in conventional TEM
- Basic conventional TEM operation, handson demonstration on LaB6 TEM - JEOL JEM 2100
- Basic conventional TEM operation, handson demonstration on Cold FEG TEM - JEOL JEM F200
- Interpreting simple images in conventional TEM
- Introduction and overview of electron diffraction techniques
- Basics of crystallography to understand electron diffraction - Part 1
- Basics of crystallography to understand electron diffraction - Part 2 A
- Basics of crystallography to understand electron diffraction - Part 2 B
- Demonstration of orienting crystal and obtaining diffraction pattern on TEM
- Understanding electron diffraction patterns
- Indexing electron diffraction patterns
- High-resolution Imaging in TEM
- HREM - Linear imaging theory and image formation mechanisms
- HREM - Multiwave imaging concepts and extension to real specimens
- HREM - Demonstration on microscope
- Scanning transmission Electron Microscopy - Concepts
- Scanning transmission Electron Microscopy - Methodology
- STEM - Demonstration on the microscope - Experimental Demonstration
- Inelastic scattering and Analytical TEM
- Into to EELS and EFTEM
- More on EELS and applications
- Aberration correction in TEM
- Demonstration on Image Corrector TEM - JEOL NeoARM 200F
- Demonstration on Probe Corrected TEM - JEOL NeoARM 200F
- Tutorial on Basic Image Operations with Digital Micrograph & ImageJ
- In‑situ & Environmental TEM using MEMS
- Course Summary - TEM, Theory of Imaging to Advanced Applications - Part 01
- Course Summary - TEM, Theory of Imaging to Advanced Applications - Part 02