Learn · Fundamentals of X-ray diffraction and Transmission electron microscopy
Lecture 22 of 27Week 8
TEM sample preparation-1
Prof. Sankaran · IIT Madras
Credits and licence
- From
- Fundamentals of X-ray diffraction and Transmission electron microscopy, IIT Madras (at NPTEL)
- Licence
- CC BY-NC-SA, as NPTEL states it. Non-commercial use only.
- Attribution
- NPTEL states: "Distributed under Creative Commons Attribution-ShareAlike / CC BY - NC - SA", beside a BY-NC-SA badge.
- Who can watch
- Tweens profiles and older. How courses are placed
All the lectures
- Basics of X-ray emission from source, electron excitation and X-ray interaction with materials in general
- Properties of X-rays
- Bragg's law derivation
- Diffraction relationship with reciprocal space
- X-ray scattering
- Factors affecting intensities of X-ray peaks
- Factors affecting intensities of X-ray peaks- continuation
- Effect of crystallite size and strain on intensity of X-rays
- Profile fit, Factors affecting peak brodening
- Indexing of diffraction pattern, Quantitative analysis
- Indexing and Quantitative analysis-continuation, Residual stress measurements
- XRD and Residual stress measurement- lab demonstration
- XRD Tutorial - 1
- XRD tutorial - 2
- Introduction to Transmission Electron Microscopy (TEM)
- Fundamentals of Transmission Electron Microscopy (TEM)
- Fundamentals of X-ray diffraction and Transmission electron microscopy
- Basics of Diffraction-2
- TEM Imaging 1
- TEM Imaging - 2
- TEM instrument demonstration
- TEM sample preparation-1
- TEM sample preparation - 2
- TEM Tutorial - 1
- TEM Tutorial - 2
- TEM Tutorial - 3
- TEM Tutorial - 4