Learn · Material Characterization
Lecture 4 of 47week-02
Lens defects,filters and light microscopy introduction
Prof. S. Sankaran · IIT Madras
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- Material Characterization, IIT Madras (at NPTEL)
- Licence
- CC BY-NC-SA, as NPTEL states it. Non-commercial use only.
- Attribution
- NPTEL states: "Distributed under Creative Commons Attribution-ShareAlike / CC BY - NC - SA", beside a BY-NC-SA badge.
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All the lectures
- Properties of light, Image formation
- Magnification and resolution
- Depth of field,focus and field of view
- Lens defects,filters and light microscopy introduction
- Optical microscope demo., Bright field imaging, opaque specimen illumination
- Opaque stop microscopy, Phase contrast microscopy
- Dark field microscopy, Polarization microscopy
- Differential interference contrast and fluorescence microscopy
- Sample preparation techniques for optical microscopy
- Tutorial problems
- continuation-Tutorial problems
- Introduction to scanning electron Microscopy
- Lens aberrations, Object resolution, Image quality
- Interaction between electrons and sample, Imaging capabilities
- SEM and its mode of operation, Effect of aperture size,Working distance,condenser lens strength
- SEM and its mode of operation- continuation
- Factors affecting Interaction volume, Demonstration of SEM
- Image formation and interpretation
- Image formation and interpretation continued, EDS, WDS
- Special contrast mechanisms, Monte Carlo simulations of Interaction volume
- Electron channeling contrast imaging (ECCI), (EBSD)-Theory & instrument demonstration
- Tutorial Problems on SEM
- Basics of X-ray emission from source, electron excitation and X-ray interaction
- Properties of X-rays
- Bragg's Law Derivation
- Diffraction relationship with reciprocal space
- X-ray scattering
- Factors affecting intensities of X-ray peaks
- Factors affecting intensities of X-ray peaks- continuation
- Effect of crystallite size and strain on intensity of X-rays
- Profile fit, Factors affecting peak brodening
- Indexing of diffraction pattern, Quantitative analysis
- Indexing, Quantitative analysis-continuation, Residual stress measurements
- XRD and Residual stress measurement- lab demonstration
- XRD Tutorial - 1
- XSD Tutorial -2
- Introduction to Transmission Electron Microscopy (TEM)
- Fundementals of Transmission Electron Microscopy (TEM)
- Basics of Diffraction-1
- Basics of Diffraction-2
- TEM imaging-1
- TEM imaging-2
- TEM instrument demonstration
- TEM sample preparation-1-
- TEM sample preparation-2
- TEM Tutorial - 1
- TEM Tutorial - 2