Learn · Techniques of Materials Characterization
Lecture 43 of 60week 9
Lecture 43 : Characteristics X-ray radiation
Prof. Shibayan Roy · IIT Kharagpur
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All the lectures
- Lecture 01 : Introduction to the course & basic principles of image formation
- Lecture 02 : Image formation, resolution, magnification, depth of field and depth of focus
- Lecture 03 : Aberrations in microscopy: General concepts
- Lecture 04 : Introduction, types and image formation in Optical microscopy
- Lecture 05 : Components of optical microscope
- Lecture 6 : Bright field and Dark field modes
- Lecture 7 : Phase contrast optical microscopy
- Lecture 08 : Polarized light microscopy
- Lecture 9 : Differential interference contrast
- Lecture 10 : Fluorescence microscopy
- Lecture 11 : Basic components of electron microscope
- Lecture 12 : Basic components of electron microscope (continued)
- Lecture 13 : Basic components of electron microscope (continued)
- Lecture 14 : Electron-material interaction
- Lecture 15 : Electron-material interaction (continued)
- Lecture 16 : Electron-material interaction (contd.) & Image formation and contrast generation
- Lecture 17 : Modes of TEM (BF & DF)
- Lecture 18 : Modes of TEM
- Lecture 19 : Modes of TEM (contd.) &Electron diffraction in TEM
- Lecture 20 : Electron diffraction in TEM
- Lecture 21 : Electron diffraction in TEM (contd.)
- Lecture 22 : Electron diffraction in TEM (contd.)
- Lecture 23 : Electron diffraction in TEM (contd.)
- Lecture 24 : Electron diffraction in TEM (contd.)
- Lecture 25 : Application of Electron diffraction
- Lecture 26 : Signal generation in SEM
- Lecture 27 : Signal generation in SEM (Continued)
- Lecture 28: Signal generation in SEM (Continued)
- Lecture 29: Signal generation in SEM (Continued)
- Lecture 30: Signal generation in SEM (Continued)
- Lecture 31 : Basic components of SEM
- Lecture 32 : Basic components of SEM (Continued)
- Lecture 33 : Optics of SEM
- Lecture 34 : Optics of SEM(Continued)
- Lecture 35 : Optics of SEM (contd.) and analytical detectors
- Lecture 36 : Analytical detectors in SEM
- Lecture 37 : Analytical (WDS) detector and contrast formation in SEM
- Lecture 38 : Imaging in SEM
- Lecture 39 : Imaging in SEM (Continued)
- Lecture 40 : Imaging in SEM (Continued)
- Lecture 41 : Imaging in SEM (Continued) & X-ray diffraction
- Lecture 42 : Continuous & characteristics X-ray spectrum
- Lecture 43 : Characteristics X-ray radiation
- Lecture 44 : Characteristics X-ray radiation (Continued) and X-ray absorption
- Lecture 45 : X-ray absorption (Continued)
- Lecture 46 : X-ray absorption and filters
- Lecture 47 : Intensity of diffracted beam
- Lecture 48 : Intensity of diffracted beam (Continued)
- Lecture 49 : Intensity of diffracted beam (Continued)
- Lecture 50 : Intensity of diffracted beam (Continued)
- Lecture 51 : Intensity of diffracted beam (Continued)
- Lecture 52 : Intensity of diffracted beam (Continued)
- Lecture 53 : Intensity of diffracted beam (Continued)
- Lecture 54 : Intensity of diffracted beam (Continued)
- Lecture 55 : Intensity of diffracted beam (Continued)
- Lecture 56 : Intensity of diffracted beam (Continued) & X-ray diffraction profile and analysis
- Lecture 57 : X-ray diffraction profile and analysis
- Lecture 58 : X-ray diffraction profile and analysis (Continued)
- Lecture 59 : X-ray diffraction profile and analysis (Continued)
- Lecture 60 : Electron backscatter diffraction (EBSD)