Learn · Scanning Electron / Ion / Probe Microscopy in Materials Characterization
Lecture 43 of 45Module 08:
Lecture 43: Summary
Prof. Debabrata Pradhan · IIT Kharagpur
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- Scanning Electron / Ion / Probe Microscopy in Materials Characterization, IIT Kharagpur (at NPTEL)
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All the lectures
- Lecture 01: Introduction to Microscopy
- Lecture 02: Scanning Electron Microscopy
- Lecture 03: SEM and Its Capabilities
- Lecture 04: Main Components of SEM - Electron Guns
- Lecture 05: Main Components of SEM - Electron Guns and Electromagnetic Lenses
- Lecture 06: Electron Probe Diameter Verses Electron Probe Current
- Lecture 07: Electron Beam - Specimen Interaction
- Lecture 08: Detectors
- Lecture 09: BSE Detector and Sample Preparation for SEM
- Lecture 10: Parameters Need to be Considered to obtain a Good SEM Image
- Lecture 11: How to Get a Good SEM Image
- Lecture 12: Additional Capabilities of SEM
- Lecture 13: Additional Capabilities of SEM (Contd.)
- Lecture 14: Additional Capabilities of SEM (Contd.)
- Lecture 15: Scanning Ion Microscopy - An Introduction
- Lecture 16: Ions Versus Electrons as Source for Microscopy
- Lecture 17: Ions Source in HIM
- Lecture 18: GFIS Properties and Ion Optical Column
- Lecture 19: Ion Optical Column
- Lecture 20: Ion-Solid Interactions and Signal Generation
- Lecture 21: Signal Generation and Contrast Mechanism
- Lecture 22: Contrast Mechanism and Imaging Modes
- Lecture 23: Scanning Transmission Ion Microscopy and Microanalysis with HIM
- Lecture 24: Creation and Modification of Materials by HIM
- Lecture 25: Scanning probe microscopy, properties of SPM
- Lecture 26: STM- Instrumentation
- Lecture 27: Main Components of STM
- Lecture 28: Main Components of STM (Contd.)
- Lecture 29: Main Components of STM (Contd.)
- Lecture 30: Working Principle of STM
- Lecture 31: Operating Modes
- Lecture 32: Scanning Tunneling Spectroscopy
- Lecture 33: SPM - Atomic Force Microscopy (AFM)
- Lecture 34:Force Between Tip and Sample in AFM
- Lecture 35: Atomic Force Microscope - Parts
- Lecture 36: Modes of AFM Operation
- Lecture 37: Dynamic mode AFM, Tapping mode
- Lecture 38: AFM Imaging
- Lecture 39: Phase Imaging, Noises and Resolution
- Lecture 40: Surface Properties Measurements using Other Forces
- Lecture 41: Surface Properties Measurements using AFM
- Lecture 42: Manipulation of Atoms, Molecules and Industrial Applications
- Lecture 43: Summary
- Live Session 25-03-2021
- Live Session 13-04-2021