Learn · Chemical Crystallography
Lecture 58 of 62Week 11
Disorder Treatment using Olex 2
Prof. Angshuman Roy Choudhury · IISER Mohali
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- Chemical Crystallography, IISER Mohali (at NPTEL)
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All the lectures
- Introduction to X-Ray Crystallography
- Sources of X-Rays, Crystal Systems and Bravais lattices
- Crystallographic Symmetries
- Equivalent Points and 1D Lattices
- 5 Fold Symmetry and 2D Lattices
- 2D Space Lattices
- Crystallographic Point Groups
- Stereographic Projections of Point Groups
- Understanding of Crystallographic Space Groups
- 2D Projection of Space Groups
- Tutorial 01
- 3D Space Groups and Equivalent Points
- Obtaining Equivalent Points by Shifting of Origin
- Representation of Orthorhombic and Tetragonal Space Groups
- Stereographic Representation of Tetragonal (P and I) Space Groups
- Tutorial 02
- Miller Indices for Crystallographic Directions and Planes
- Miller Indices and Planar Densities
- Cubic Structues and atomic packing factors
- Ceramic Structures
- Theory of X-Ray Diffraction
- Tutorial 03
- Origin of Reciprocal Lattice
- Bragg's Law in Reciprocal Lattice and Origin of Systematic Absences
- Systematic Absences and Crystallisation Methods
- Special Method of Crystallisation
- Tutorial
- Single Crystal X-Ray Diffraction Data Collection
- Diffractometers
- Diffractometers and Detectors
- Laue's and Bragg's Analysis
- Experimental Methods and Theoretical Understanding of X-Ray Diffraction
- Derivation of Friedel's Law from Structure Factor by Vector Space Diagram
- Structure Factor and Electron Density
- Systematic absence conditions from special structure factor expression
- Systematic Absence Conditions from Special Structure Factor Expression
- Single Crystal X-Ray Diffractometer
- Understanding the X-Ray Data
- Data Handling (Solution and Refinement) using Various Crystallographic Packages
- Structure Solution using Apex II (Bruker Diffractometer)
- Structure Solution using Olex 2 (Rigaku Diffractometer)
- Structure Refinement
- Cambridge Structure Database and its Application
- Data Reduction-Absorption Correction
- Data Reduction-Lorentz and Polarization Correction
- Data Reduction- Scale and Temperature Factor
- Identification from Intensity Statistics the Correct Crystal System and Presence of Inversion Center
- Identification from Intensity Statistics the presence of 2 fold axis in Lattice
- Phase Problem
- Direct Methods - Part 01
- Direct Methods - Part 02
- Sigma 1 and Triplet Relationship
- Patterson Method
- Powder X-Ray Diffractometer -Theory
- Powder X-Ray Diffractometer -Lab
- Disorders in Crystal Structures
- Theoretical Understanding of the Treatment of Disordered Structures
- Disorder Treatment using Olex 2
- Indexing of PXRD using Debye - Scherrer Method
- SCXRD Data Processing with more than one Single Crystal or a Cracked Crystal
- Polymorphs - 1
- Polymorphs - 2