Learn · Augmenting Quality and Throughput of Functional Testing and Device Characterization for the ABCStar ATLAS-ITk Strips Readout ASIC Through a Semiconductor Test Industry Partnership
Talk2021-09-2422 min
Augmenting Quality and Throughput of Functional Testing and Device Characterization for the ABCStar ATLAS-ITk Strips Readout ASIC Through a Semiconductor Test Industry Partnership
James Michael Botte · CERN
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- Augmenting Quality and Throughput of Functional Testing and Device Characterization for the ABCStar ATLAS-ITk Strips Readout ASIC Through a Semiconductor Test Industry Partnership, CERN (at CERN)
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- CERN, as CERN states it.
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- © CERN. CERN provides its audiovisual media free of charge for educational and informational use, credited to CERN; this lecture is shown in CERN's own player.
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