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Talk22 min

Augmenting Quality and Throughput of Functional Testing and Device Characterization for the ABCStar ATLAS-ITk Strips Readout ASIC Through a Semiconductor Test Industry Partnership

James Michael Botte · CERN

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About

To instrument the 60 million ATLAS ITk Strips Sensor channels, CERN developed the mixed-signal ABCStar front-end readout ASIC. Over 350,000 devices on 753 wafers containing 466 ASICs each will be extensively tested to provide the chips required for sensor modules. Carleton achieved a 3-10 times improvement in throughput, without compromising test coverage or data collection, by developing new tools and techniques in partnership with a specialist wafer testing company – jointly overcoming the methodological, technical, and semantic divides that exist between physics laboratories and the semiconductor test industry, and opening new possibilities in ASIC testing for future particle physics projects..

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The talk

  1. Augmenting Quality and Throughput of Functional Testing and Device Characterization for the ABCStar ATLAS-ITk Strips Readout ASIC Through a Semiconductor Test Industry Partnership 2021-09-24 · 22 min · CERN's player

Credits and licence

Institution
CERN
Department
Conferences
Speaker
James Michael Botte
Year
2021
Language
English
Subjects
Physics, Engineering
Source
CERN
Licence
CERN, as CERN states it. CERN's terms
Attribution
© CERN. CERN provides its audiovisual media free of charge for educational and informational use, credited to CERN; this lecture is shown in CERN's own player.
Who can watch
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