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3: Atomic Force Microscopy

TLP Library I · LibreTexts

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    From LibreTexts, under CC BY-NC-SA 2.0, as the source states it; its equations are written in TeX, which the PDF shows typeset. This page at LibreTexts.

    https://www.doitpoms.ac.uk/tlplib/afm/index.php

    Learning Objectives

    • Understand the basic principles of atomic force microscopy (AFM), including the different modes it can be used in.
    • Understand how AFM can be used in materials science.
    • Be aware of some of the problems that can be encountered, and how to overcome them.

    Before You Start

    You should have a basic understanding of the behaviour of piezoelectric materials to understand how the piezo-scanner works in AFM

    This page titled 3: Atomic Force Microscopy was last modified on Thu, 26 Nov 2020 20:30:55 GMT and is shared under a CC BY-NC-SA 2.0 license and was authored, remixed, and/or curated by Dissemination of IT for the Promotion of Materials Science (DoITPoMS) via source content that was edited to the style and standards of the LibreTexts platform.