MIT2-830JS08
MIT OpenCourseWare
EducationScience
Low resolution (480×360): this is the archive's own copy.
Parts
About
This course explores statistical modeling and control in manufacturing processes. Topics include the use of experimental design and response surface modeling to understand manufacturing process physics, as well as defect and parametric yield modeling and optimization. Various forms of process control, including statistical process control, run by run and adaptive control, and real-time feedback control, are covered. Application contexts include semiconductor manufacturing, conventional metal and polymer processing, and emerging micro-nano manufacturing processes.
- Archive
- Internet Archive, in MIT OpenCourseWare
- Licence or status
- CC BY-NC-SA 3.0, as the Internet Archive states it.
- Credit
- MIT OpenCourseWare
- Language
- English
- Who can watch
- The archive gives no rating. Invisible Network shows it to Tweens profiles and older, judged from its collection and subjects. How films are placed