Intensity Measurements

About

Analog-to-digital conversion is a crucial part of nearly all beam instrumentation systems. Ideally, in a well-engineered system, the used analog to digital converter (ADC) should not be the factor that limits overall performance. However, despite continuous advancements in ADC technology, this ideal is often not possible and the choice of ADC significantly influences or even restricts the final system performance. Consequently, it is essential to estimate the requirements for analog-to-digital conversion at an early stage of system design and determine if an adequate ADC exists to meet the system specification. For beam instrumentation systems demanding both high temporal and amplitude resolution, available converters often cannot meet the necessary specifications without specialised analog signal processing prior to digitisation. In such cases the ADC requirements may even determine the entire system architecture. This lecture aims to assist designers of beam instrumentation systems in the often iterative process of selecting an adequate ADC, offering an optimal trade-off between system performance, complexity and cost. As analog to digital conversion is extensively covered in existing literature, this lecture focusses primarily on aspects related to beam instrumentation systems.

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