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Single Event Effects on the RD53B Pixel Chip Digital Logic and On-chip CDR

Jelena Lalic · CERN

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About

The RD53B chip for HL-LHC upgrades of ATLAS and CMS needs to provide reliable operation in a radiation hostile environment with inevitable Single Event Effects. To answer the challenge, substantial efforts are made to protect and evaluate the critical parts of digital logic with different TMR schemes and to characterize the on-chip CDR. Cross-section for each TMR scheme and its effective SEE sensitivity are measured in several SEE campaigns. The on-chip CDR is characterized by measuring the SEE-induced phase shifts of its output clocks and their implication on the high-speed link stability. Results from these campaigns will be presented..

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The talk

  1. Single Event Effects on the RD53B Pixel Chip Digital Logic and On-chip CDR 2021-09-23 · 20 min · CERN's player

Credits and licence

Institution
CERN
Department
Conferences
Speaker
Jelena Lalic
Year
2021
Language
English
Subjects
Physics, Engineering
Source
CERN
Licence
CERN, as CERN states it. CERN's terms
Attribution
© CERN. CERN provides its audiovisual media free of charge for educational and informational use, credited to CERN; this lecture is shown in CERN's own player.
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