About
The development of the MPA and SSA ASICs is approaching the production phase with a volume of more than 1000 wafers. The importance of yield management in the construction of the Outer Tracker modules requires rigorous testing methods capable to identify all defective parts. This contribution presents customized Design for Testability methods to replace the currently used functional tests that show limited coverage and long testing time. Scan-chain design, memory and Logic Built-In-Self-Test have been adapted for radiation-hard ASICs and introduced on-chip for a novel testing approach. Design flow and implementation choices will be presented together with silicon results..
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The talk
Credits and licence
- Institution
- CERN
- Department
- Conferences
- Speaker
- Gianmario Bergamin
- Year
- 2021
- Language
- English
- Subjects
- Physics, Engineering
- Source
- CERN
- Licence
- CERN, as CERN states it. CERN's terms
- Attribution
- © CERN. CERN provides its audiovisual media free of charge for educational and informational use, credited to CERN; this lecture is shown in CERN's own player.
- Who can watch
- CERN gives no rating. Invisible Network shows it to Tweens profiles and older, judged from what the source says about it. How courses are placed