Electronics challenges and considerations including triggered vs data push architectures

Walter Snoeys · CERN

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Electronics challenges and considerations including triggered vs data push architectures.

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Institution: CERN
Department: Workshops
Speaker: Walter Snoeys
Year: 2024
Language: English
Subjects: Engineering
Source: CERN
Licence: CERN, as CERN states it. CERN's terms
Attribution: © CERN. CERN provides its audiovisual media free of charge for educational and informational use, credited to CERN; this lecture is shown in CERN's own player.
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