# MIT2-830JS08

This course explores statistical modeling and control in manufacturing processes. Topics include the use of experimental design and response surface modeling to understand manufacturing process physics, as well as defect and parametric yield modeling and optimization. Various forms of process control, including statistical process control, run by run and adaptive control, and real-time feedback control, are covered. Application contexts include semiconductor manufacturing, conventional metal and polymer processing, and emerging micro-nano manufacturing processes.

- Kind: Talk
- Year: 2008
- By: MIT OpenCourseWare
- Genres: Education, Science
- Archive: [Internet Archive](https://archive.org/details/MIT2-830JS08)
- Licence or status: [CC BY-NC-SA 3.0](http://creativecommons.org/licenses/by-nc-sa/3.0/) (as the archive states it)
- Who can watch: Tweens profiles and older (the archive gives no rating; placed by Invisible Network from its collection and subjects)

[Watch now](https://invisiblenetwork.ai/watch/archive/ia/MIT2-830JS08?play=1)