# Augmenting Quality and Throughput of Functional Testing and Device Characterization for the ABCStar ATLAS-ITk Strips Readout ASIC Through a Semiconductor Test Industry Partnership

- Institution: CERN
- Department: Conferences
- Speaker: James Michael Botte
- Year: 2021
- Language: English
- Subjects: Physics, Engineering
- Source: [CERN](https://videos.cern.ch/record/3018535)
- Licence: [CERN](http://copyright.web.cern.ch)
- Who can watch: Tweens profiles and older (sources give no ratings; placed by Invisible Network from the source's own words)

To instrument the 60 million ATLAS ITk Strips Sensor channels, CERN developed the mixed-signal ABCStar front-end readout ASIC. Over 350,000 devices on 753 wafers containing 466 ASICs each will be extensively tested to provide the chips required for sensor modules. Carleton achieved a 3-10 times improvement in throughput, without compromising test coverage or data collection, by developing new tools and techniques in partnership with a specialist wafer testing company – jointly overcoming the methodological, technical, and semantic divides that exist between physics laboratories and the semiconductor test industry, and opening new possibilities in ASIC testing for future particle physics projects..

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## Lectures

1. [Augmenting Quality and Throughput of Functional Testing and Device Characterization for the ABCStar ATLAS-ITk Strips Readout ASIC Through a Semiconductor Test Industry Partnership](https://invisiblenetwork.ai/learn/cern/3018535/aaabefb37808), 22 min (CERN's player)